Analytic Continual Test-Time Adaptation for Multi-Modality Corruption
Analytic Continual Test-Time Adaptation for Multi-Modality Corruption
Test-Time Adaptation (TTA) enables pre-trained models to bridge the gap between source and target datasets using unlabeled test data, addressing domain shifts caused by corruptions like weather changes, noise, or sensor malfunctions in test time. Multi-Modal Continual Test-Time Adaptation (MM-CTTA), as an extension of standard TTA, further allows models to handle multi-modal inputs and adapt to continuously evolving target domains. However, MM-CTTA faces critical challenges such as catastrophic forgetting and reliability bias, which are rarely addressed effectively under multi-modal corruption scenarios. In this paper, we propose a novel approach, Multi-modality Dynamic Analytic Adapter (MDAA), to tackle MM-CTTA tasks. MDAA introduces analytic learning,a closed-form training technique,through Analytic Classifiers (ACs) to mitigate catastrophic forgetting. Furthermore, we design the Dynamic Late Fusion Mechanism (DLFM) to dynamically select and integrate reliable information from different modalities. Extensive experiments show that MDAA achieves state-of-the-art performance across the proposed tasks.
Yufei Zhang、Yicheng Xu、Hongxin Wei、Zhiping Lin、Xiaofeng Zou、Cen Chen、Huiping Zhuang
计算技术、计算机技术
Yufei Zhang,Yicheng Xu,Hongxin Wei,Zhiping Lin,Xiaofeng Zou,Cen Chen,Huiping Zhuang.Analytic Continual Test-Time Adaptation for Multi-Modality Corruption[EB/OL].(2025-07-27)[2025-08-16].https://arxiv.org/abs/2410.22373.点此复制
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