A low-background setup for in-situ X-ray total scattering combined with fast scanning calorimetry

We demonstrate a setup combining fast scanning calorimetry with X-ray total scattering at a synchrotron beamline, allowing for \emph{in-situ} characterizations of the nano-scale structure of samples during and after temperature scans. The setup features a portable vacuum chamber giving high signal-to-background ratio even on amorphous samples, which enables the observation of detailed structural changes between different sample states. We show three use cases, including one which leverages the high cooling rate of 10$^4$\,K/s achievable by this setup. Our demonstration opens the door to various applications in materials science where it is important to understand the interplay between structure and thermodynamics.