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Ultrasensitive Transverse Deflection Measurement with Two-photon Interference

Ultrasensitive Transverse Deflection Measurement with Two-photon Interference

来源:Arxiv_logoArxiv
英文摘要

Hong-Ou-Mandel (HOM) interference is an intrinsic quantum phenomena that goes beyond the possibilities of classical physics, and enables various applications in quantum metrology. While the timing resolution of HOM-based sensor is generally investigated, the ultimate quantum sensitivity in the estimation of transverse deflection or displacement between paired photons interfering at a balanced beam splitter has been explored relatively little. Here, we present an experimental demonstration of a spatial HOM interferometry for measuring the transverse deflection of an optical beam by using transverse momentum sampling measurements. This feasible scheme suffices to achieve great precision with comparatively little technological effort, which circumvents the stringent requirement in direct imaging resolution at the diffraction limit. We can adaptively determine optimum working points using a Fisher information analysis, and demonstrate an optimized spatial HOM interferometry according to practical applications. These results may significantly facilitate the use of quantum interference for high precision spatial sensing, and pave the way to more complex quantum imaging techniques like nanoscopic microscopy.

Chaojie Wang、Yuning Zhang、Yuanyuan Chen、LixiangChen

物理学光电子技术

Chaojie Wang,Yuning Zhang,Yuanyuan Chen,LixiangChen.Ultrasensitive Transverse Deflection Measurement with Two-photon Interference[EB/OL].(2025-04-06)[2025-05-16].https://arxiv.org/abs/2504.04397.点此复制

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