Characterization of the Electronic Noise in the Readout of Resistive Micromegas in the High-Angle Time Projection Chambers of the T2K Experiment
Characterization of the Electronic Noise in the Readout of Resistive Micromegas in the High-Angle Time Projection Chambers of the T2K Experiment
The two high-angle Time Projection Chambers of the T2K experiment are equipped with a new readout system based on resistive Micromegas detector technology, and utilize custom-made electronics based on AFTER chips for signal processing. This study analyzes and characterizes the electronic noise of the detector readout chain to develop a comprehensive noise model. The model enables the generation of Monte Carlo simulations to investigate systematic effects in signal processing. The analysis is based on data collected from 32 resistive Micromegas detectors, recorded without zero suppression. All detectors exhibit a quasi-identical and time-stable noise level. The developed analytical model accurately describes the observed noise, and derived Monte Carlo simulations show excellent agreement with experimental data.
M. Zito、D. Attié、P. Billoir、G. Bortolato、S. Bolognesi、N. F. Calabria、D. Calvet、M. G. Catanesi、G. Collazuol、P. Colas、D. D'Ago、T. Daret、A. Delbart、J. Dumarchez、S. Emery-Schrenk、M. Feltre、C. Forza、A. N. Gacino Olmedo、C. Giganti、M. Guigue、G. Eurin、S. Hassani、D. Henaff、S. Joshi、J. F. Laporte、S. Levorato、T. Lux、L. Magaletti、L. Mareso、M. Mattiazzi、E. Miller、B. Popov、C. Pastore、C. Pió、E. Radicioni、L. Russo、S. Roth、W. Saenz Arevalo、L. Scomparin、Ph. Schune、D. Smyczek、J. Steinmann、N. Thamm、U. Virginet、G. Vasseur、M. Varghese、V. Valentino
电子元件、电子组件电子电路
M. Zito,D. Attié,P. Billoir,G. Bortolato,S. Bolognesi,N. F. Calabria,D. Calvet,M. G. Catanesi,G. Collazuol,P. Colas,D. D'Ago,T. Daret,A. Delbart,J. Dumarchez,S. Emery-Schrenk,M. Feltre,C. Forza,A. N. Gacino Olmedo,C. Giganti,M. Guigue,G. Eurin,S. Hassani,D. Henaff,S. Joshi,J. F. Laporte,S. Levorato,T. Lux,L. Magaletti,L. Mareso,M. Mattiazzi,E. Miller,B. Popov,C. Pastore,C. Pió,E. Radicioni,L. Russo,S. Roth,W. Saenz Arevalo,L. Scomparin,Ph. Schune,D. Smyczek,J. Steinmann,N. Thamm,U. Virginet,G. Vasseur,M. Varghese,V. Valentino.Characterization of the Electronic Noise in the Readout of Resistive Micromegas in the High-Angle Time Projection Chambers of the T2K Experiment[EB/OL].(2025-04-10)[2025-06-28].https://arxiv.org/abs/2504.07759.点此复制
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