首页|Probing Temperature at Nanoscale through Thermal Vibration Characterization using Scanning Precession Electron Diffraction

Probing Temperature at Nanoscale through Thermal Vibration Characterization using Scanning Precession Electron Diffraction

Kun Yang Chao Zhang Chengwei Wu Qian Du Bingzhi Li Zhen Fang Liang Li Jianbo Wu Tianru Wu Hui Wang Tao Deng Wenpei Gao

来源：

Arxiv

Probing Temperature at Nanoscale through Thermal Vibration Characterization using Scanning Precession Electron Diffraction

Kun Yang Chao Zhang Chengwei Wu Qian Du Bingzhi Li Zhen Fang Liang Li Jianbo Wu Tianru Wu Hui Wang Tao Deng Wenpei Gao

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Kun Yang,Chao Zhang,Chengwei Wu,Qian Du,Bingzhi Li,Zhen Fang,Liang Li,Jianbo Wu,Tianru Wu,Hui Wang,Tao Deng,Wenpei Gao.Probing Temperature at Nanoscale through Thermal Vibration Characterization using Scanning Precession Electron Diffraction[EB/OL].(2025-04-14)[2025-12-13].https://arxiv.org/abs/2504.09937.

学科分类

物理学/无线电设备、电信设备/工程基础科学

首发时间： 2025-04-14

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Probing Temperature at Nanoscale through Thermal Vibration Characterization using Scanning Precession Electron Diffraction

Probing Temperature at Nanoscale through Thermal Vibration Characterization using Scanning Precession Electron Diffraction

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