束流阻挡器（Beamstop）散射对小角X射线散射强度的影响

s an important technique for structural characterization at the nanoscale, small angle X-ray scattering (SAXS) plays an irreplaceable role in the study of polymer material structures, and the application of synchrotron radiation SAXS technology has achieved a qualitative leap in spatial and temporal resolution, providing robust technical support for the multi-scale structural characterization of polymer materials. When X-rays pass through a sample, the SAXS intensity is closely related to the electron density difference between the scattering phases in the sample. If the electron density difference between the scattering phases is zero, SAXS technology cannot detect the structure of the scattering phases. In order to obtain accurate scattering intensity signals, before analyzing SAXS data, one usually needs to preprocess the relevant data by desmearing, normalizing, and subtracting the background scattering, and then calculate the structural parameters of the sample. The above preprocessing mainly considers the possible effects of slit parasitic diffraction, light source changes, and scattering outside the sample, with little consideration given to the possible impact of beam blockers on SAXS intensity. The influence of Beamstop during the synchrotron radiation SAXS experiment was discussed for avoiding its impact in SAXS measurements.