Exploring Large Quantities of Secondary Data from High-Resolution Synchrotron X-ray Computed Tomography Scans Using AccuStripes
Exploring Large Quantities of Secondary Data from High-Resolution Synchrotron X-ray Computed Tomography Scans Using AccuStripes
The analysis of secondary quantitative data extracted from high-resolution synchrotron X-ray computed tomography scans represents a significant challenge for users. While a number of methods have been introduced for processing large three-dimensional images in order to generate secondary data, there are only a few techniques available for simple and intuitive visualization of such data in their entirety. This work employs the AccuStripes visualization technique for that purpose, which enables the visual analysis of secondary data represented by an ensemble of univariate distributions. It supports different schemes for adaptive histogram binnings in combination with several ways of rendering aggregated data and it allows the interactive selection of optimal visual representations depending on the data and the use case. We demonstrate the usability of AccuStripes on a high-resolution synchrotron scan of a particle-reinforced metal matrix composite sample, containing more than 20 million particles. Through AccuStripes, detailed insights are facilitated into distributions of derived particle characteristics of the entire sample. Furthermore, research questions such as how the overall shape of the particles is or how homogeneously they are distributed across the sample can be answered.
Anja Heim、Thomas Lang、Christoph Heinzl
物理学计算技术、计算机技术
Anja Heim,Thomas Lang,Christoph Heinzl.Exploring Large Quantities of Secondary Data from High-Resolution Synchrotron X-ray Computed Tomography Scans Using AccuStripes[EB/OL].(2025-05-15)[2025-07-16].https://arxiv.org/abs/2505.10098.点此复制
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