Resonant Island Trapping in a Fourth-Generation Synchrotron Light Source

We report the first direct observation of nonlinear resonance island trapping in a fourth-generation light source with working points far from the excited resonance and examine the nonlinear dynamics and properties of the trapped beam. The discovered dynamics of island trapping may help understand bunch purity and halo formation issues, create additional experimental capabilities for photon science applications, and present means of nonlinear characterization of the machine optics.