Using In-Context Learning for Automatic Defect Labelling of Display Manufacturing Data
Using In-Context Learning for Automatic Defect Labelling of Display Manufacturing Data
This paper presents an AI-assisted auto-labeling system for display panel defect detection that leverages in-context learning capabilities. We adopt and enhance the SegGPT architecture with several domain-specific training techniques and introduce a scribble-based annotation mechanism to streamline the labeling process. Our two-stage training approach, validated on industrial display panel datasets, demonstrates significant improvements over the baseline model, achieving an average IoU increase of 0.22 and a 14% improvement in recall across multiple product types, while maintaining approximately 60% auto-labeling coverage. Experimental results show that models trained on our auto-labeled data match the performance of those trained on human-labeled data, offering a practical solution for reducing manual annotation efforts in industrial inspection systems.
Babar Hussain、Qiang Liu、Gang Chen、Bihai She、Dahai Yu
电子元件、电子组件电子技术应用计算技术、计算机技术
Babar Hussain,Qiang Liu,Gang Chen,Bihai She,Dahai Yu.Using In-Context Learning for Automatic Defect Labelling of Display Manufacturing Data[EB/OL].(2025-06-05)[2025-06-13].https://arxiv.org/abs/2506.04717.点此复制
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