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Identity Testing for Circuits with Exponentiation Gates

Identity Testing for Circuits with Exponentiation Gates

来源:Arxiv_logoArxiv
英文摘要

Motivated by practical applications in the design of optimization compilers for neural networks, we initiated the study of identity testing problems for arithmetic circuits augmented with \emph{exponentiation gates} that compute the real function $x\mapsto e^x$. These circuits compute real functions of form $P(\vec x)/P'(\vec x)$, where both $P(\vec x)$ and $P'(\vec x)$ are exponential polynomials \[ \sum_{i=1}^k f_i(\vec x)\cdot \exp\left(\frac{g_i(\vec x)}{h_i(\vec x)}\right), \] for polynomials $f_i(\vec x),g_i(\vec x)$, and $h_i(\vec x)$. We formalize a black-box query model over finite fields for this class of circuits, which is mathematical simple and reflects constraints faced by real-world neural network compilers. We proved that a simple and efficient randomized identity testing algorithm achieves perfect completeness and non-trivial soundness. Concurrent with our work, the algorithm has been implemented in the optimization compiler Mirage by Wu et al.~(OSDI 2025), demonstrating promising empirical performance in both efficiency and soundness error. Finally, we propose a number-theoretic conjecture under which our algorithm is sound with high probability.

Jiatu Li、Mengdi Wu

计算技术、计算机技术

Jiatu Li,Mengdi Wu.Identity Testing for Circuits with Exponentiation Gates[EB/OL].(2025-06-04)[2025-06-17].https://arxiv.org/abs/2506.04529.点此复制

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