Theoretical prediction of ultrasensitive sensing in 3D stochastic interferometry

We show that a random light field can be used for high-precision metrology purposes, given the introduction of specific boundary conditions in the form of Lambertian reflections inside a cavity. We demonstrate a quantifiable and reproducible interferometric response to minute perturbations in wavelength, refractive index, and geometry, predicting high sensitivities in good agreement with experimental measurements of geometrical deformations down to the picometer.