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An Improved Lower Bound for the Critical Parameter of the Stavskaya's Process via a Generalized Recurrent Method

An Improved Lower Bound for the Critical Parameter of the Stavskaya's Process via a Generalized Recurrent Method

来源:Arxiv_logoArxiv
英文摘要

Stavskaya's process, a discrete-time version of the contact process on $\Z$, is known to exhibit a phase transition at a critical parameter $\alpc$ whose exact value remains an open problem. Recent work by Ramos et al. established a lower bound by linking the process's survival to the non-percolation of a dual contour. The probability of this contour was estimated using a recurrent method on a state space of weighted random walks with short-term memory. In this paper, we generalize and extend this method by systematically increasing the walk's memory and enriching the set of forbidden path sequences. By increasing the memory up to a length of 20 steps (corresponding to our parameter $n=7$), we formulate the problem with a one-step transition matrix and numerically optimize its spectral radius. We thus establish the new lower bound $\alpc > 0.1370721$.

Olivier Couronné

数学

Olivier Couronné.An Improved Lower Bound for the Critical Parameter of the Stavskaya's Process via a Generalized Recurrent Method[EB/OL].(2025-07-03)[2025-08-03].https://arxiv.org/abs/2507.02452.点此复制

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