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A Crystallographic Metric for Continuous Quantification of Unit Cell Deformation

A Crystallographic Metric for Continuous Quantification of Unit Cell Deformation

来源:Arxiv_logoArxiv
英文摘要

Describing the deviation of a real structure from a hypothetical higher-symmetry ideal can be a powerful tool to understand and interpret phase transitions. Here we introduce a simple yet effective metric that quantifies the degree of unit cell distortion relative to a cube, called the cubic deviation metric. This enables continuous comparisons between unit cells of different geometries. We demonstrate the potential of this tool with four separate case study applications to real material systems: 1) discontinuous structural phase transitions in pseudobrookites; 2) homological structure classification; 3) structure-correlated piezoelectricity in hexagonal materials; and 4) superconducting materials design in the cuprate family. Although this metric does not replace detailed structural or group theory analysis, it enables comparison across different compositional and structural compound variants, even in the presence of disorder or absence of group-subgroup correlation.

Shannon Bernier、Gregory Bassen、Matthew Brem、Davor Tolj、Quentin Simmons、Tyrel M. McQueen

晶体学

Shannon Bernier,Gregory Bassen,Matthew Brem,Davor Tolj,Quentin Simmons,Tyrel M. McQueen.A Crystallographic Metric for Continuous Quantification of Unit Cell Deformation[EB/OL].(2025-08-02)[2025-08-26].https://arxiv.org/abs/2508.01177.点此复制

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