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Using Large Language Models to Measure Symptom Severity in Patients At Risk for Schizophrenia

Using Large Language Models to Measure Symptom Severity in Patients At Risk for Schizophrenia

来源:Arxiv_logoArxiv
英文摘要

Patients who are at clinical high risk (CHR) for schizophrenia need close monitoring of their symptoms to inform appropriate treatments. The Brief Psychiatric Rating Scale (BPRS) is a validated, commonly used research tool for measuring symptoms in patients with schizophrenia and other psychotic disorders; however, it is not commonly used in clinical practice as it requires a lengthy structured interview. Here, we utilize large language models (LLMs) to predict BPRS scores from clinical interview transcripts in 409 CHR patients from the Accelerating Medicines Partnership Schizophrenia (AMP-SCZ) cohort. Despite the interviews not being specifically structured to measure the BPRS, the zero-shot performance of the LLM predictions compared to the true assessment (median concordance: 0.84, ICC: 0.73) approaches human inter- and intra-rater reliability. We further demonstrate that LLMs have substantial potential to improve and standardize the assessment of CHR patients via their accuracy in assessing the BPRS in foreign languages (median concordance: 0.88, ICC: 0.70), and integrating longitudinal information in a one-shot or few-shot learning approach.

Andrew X. Chen、Guillermo Horga、Sean Escola

医学研究方法神经病学、精神病学计算技术、计算机技术

Andrew X. Chen,Guillermo Horga,Sean Escola.Using Large Language Models to Measure Symptom Severity in Patients At Risk for Schizophrenia[EB/OL].(2025-08-13)[2025-08-24].https://arxiv.org/abs/2508.10226.点此复制

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