首页|Image-Intrinsic Priors for Integrated Circuit Defect Detection and Novel Class Discovery via Self-Supervised Learning

Image-Intrinsic Priors for Integrated Circuit Defect Detection and Novel Class Discovery via Self-Supervised Learning

Botong. Zhao Xubin. Wang Shujing. Lyu Yue. Lu

来源：

Arxiv

Image-Intrinsic Priors for Integrated Circuit Defect Detection and Novel Class Discovery via Self-Supervised Learning

Botong. Zhao Xubin. Wang Shujing. Lyu Yue. Lu

作者信息

引用本文复制引用

Botong. Zhao,Xubin. Wang,Shujing. Lyu,Yue. Lu.Image-Intrinsic Priors for Integrated Circuit Defect Detection and Novel Class Discovery via Self-Supervised Learning[EB/OL].(2025-11-05)[2025-12-18].https://arxiv.org/abs/2511.03120.

学科分类

微电子学、集成电路

首发时间： 2025-11-05

下载量：0

点击量：26

段落导航

Image-Intrinsic Priors for Integrated Circuit Defect Detection and Novel Class Discovery via Self-Supervised Learning

Image-Intrinsic Priors for Integrated Circuit Defect Detection and Novel Class Discovery via Self-Supervised Learning

引用本文复制引用

学科分类

评论