X射线光电子谱研究ZnMgO/ZnO薄膜异质结能阶

In this paper, Zn0.8Mg0.2O/ZnO thin film heterostructures with different ZnMgO layer thicknesses were deposited on sapphire substrate by using pulsed laser deposition. Single layer of ZnO thin film was also deposited on sapphire substrate. X-ray diffraction results show hexagonal wurtzite crystalline structrue for both ZnMgO/ZnO heterostructure and ZnO single layer films. X-ray photoelectron spectroscopy was used to determine the valence band offset of ZnMgO/ZnO heterostructure. A value of △Ev=0.06±0.01 eV was obtained by X-ray photoelectron spectroscopy measurements. Conduction band offset for ZnMgO/ZnO is determined to be 0.34±0.01 eV.