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切片技术在聚合物材料显微学表征中的应用

pplication of sectioning technology in microscopy characterization of polymer materials

中文摘要英文摘要

通过切片过程可将聚合物材料切割成适合透射电子显微镜(TEM)、原子力显微镜(AFM)、光学显微镜(LM)等显微学表征的薄片,将切片技术与显微学表征技术结合起来研究聚合物材料的形貌结构,对于优化聚合物材料的配方、制备工艺条件及材料的性能有重要作用。通过优化切片技术参数并加强切片技术与更多最新的显微表征手段的结合可以进一步发挥切片技术在聚合物材料显微学研究中的潜在作用。

Polymer materials could be cut into thin slices that are suitable for the microscopy characterization like transmission electron microscope(TEM), atomic force microscope(AFM), optical microscope(LM) and so on. The research on the morphology and structure of polymer materials by combining sectioning technology with microscopy is very important for the optimization of the formulation, preparing and manufacturing parameters and performance of polymer materials. The sectioning technology would play an even more important role in the microscopy characterization of polymer materials by optimizing the sectioning parameters and combining the sectioning technology with newly-developed microscopy characterization techniques.

陈利

材料科学高分子化合物工业合成树脂工业、塑料工业

聚合物材料切片技术显微学表征

polymer materialssectioning technologymicroscopy characterization

陈利.切片技术在聚合物材料显微学表征中的应用[EB/OL].(2013-04-11)[2025-08-16].http://www.paper.edu.cn/releasepaper/content/201304-264.点此复制

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