集成电路芯片测试仪的设计

his design based on the U.S. Cygnal’s high-performance C8051F020 MCU design scheme, mainly by the detection circuit, control circuit, keyboard parts and dot-matrix LCD modules so on. It test the 74 series integrated chip logic function to determine the chip’s good or bad. It can show the result through the LCD displays. In the test process, the MCU receives data from the keyboard of the tested chip information, and then send a signal to the chip under test. The output signals of the chip under test will be compared with the truth table in the memory of the Micro Control Unit to determine the chip’s good or bad and then displays the appropriate information.