在自动测试系统下调整闪存的参考阈值电压

o satisfy the growing demand of market for high-volume flash memories, chip manufacturers usually adopt multi-level technology to increase the storage density. In the front-end testing of flash memories, threshold voltage trimming plays important role, and it helps enhancing the reliability of the product. In this article, the fundamentals of trimming is introduced and an implementation of trimming on ATE is proposed. Test program is developed and debugged to take advantage of parametric measurement unit and function test unit inside the system, and the threshold voltage trimming is performed on multiple chips parallelly. This implementation is of high efficiency and good accuracy, and is of reference significance to testing time & cost reduction in high-volume production test.