基于USB接口的边界扫描控制器设计

With the developing of very large-scale integrated circuit and the applying of nanometer technology. It is difficult to test the complicated circuit quickly and efficaciously by traditional test method, Boundary-Scan technique is a standard technique for the test of digital circuit boards, which can improve the testability and controllability of complex digital circuits effectively by means of embedding special boundary scan cells inside the circuits. A boundary scan controller with the USB interface is designed. Which selected the FTDI's popular chip called FTD2232H, the chip can achieve two-way conversion between USB and JTAG the data's receive and send and a variety of conversion protocol done by the converter independenly.Test results show it is an easy and fast way to achieve built-in test for circuits and has the characteristic of plug and play.