首页|Improving wide-band mass measurements in a multi-reflection
time-of-flight mass spectrograph by usage of a concomitant measurement scheme
Improving wide-band mass measurements in a multi-reflection time-of-flight mass spectrograph by usage of a concomitant measurement scheme
Improving wide-band mass measurements in a multi-reflection time-of-flight mass spectrograph by usage of a concomitant measurement scheme
We introduce a new concomitant referencing mode for operating a multi-reflection time-of-flight mass spectrograph (MRTOF-MS), wherein the reference and analyte ions are interleaved on a cycle by cycle bases. Using this mode, we demonstrate an improved technique for performing wide bandwidth mass measurements via MRTOF-MS. This new technique offers a simplified analysis and high-accuracy.
H. Miyatake、M. Wada、P. Schury、M. Rosenbusch、Y. Ito、H. Wollnik
物理学
H. Miyatake,M. Wada,P. Schury,M. Rosenbusch,Y. Ito,H. Wollnik.Improving wide-band mass measurements in a multi-reflection time-of-flight mass spectrograph by usage of a concomitant measurement scheme[EB/OL].(2018-05-17)[2025-08-02].https://arxiv.org/abs/1805.07023.点此复制
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