一种可靠的防单粒子翻转系统设计
reliable system for signle event upset defense
SRAM型FPGA逻辑集成度高、且可重新编程,广泛应用于各种领域。空间应用及高辐射条件下必须考虑单粒子翻转(SEU)的对系统的影响。本文以VIRTEX2系列FPGA为例,通过分析FPGA中可编程配置存储器结构,实现了一种可靠地SEU防护设计。该设计充分运用了定时回读、定时部分重配和三模冗余技术的优点,并合理地将三者结合在一起。该设计在模拟SEU的故障注入系统中进行了大量测试,测试结果证明了该设计中将三者结合的正确性和必要性。
SRAM-based Fieled Programmable Gate Array(FPGA) is widely used in the field of space because the logic is highly integrated, and it can be reprogrammed. Signle Event Upset (SEU) must be considered in the aerospace applications.This paper took VIRTEX2 series FPGA for example,according to the FPGA configuration memory structure, the paper proposed a reliable SEU defense method. The method made full use of the advantages of timed readback、partial reconfiguration and triple modular redundancy(TMR), and combined these to enhance the ability of FPGA's anti-SEU.In the final the paper designed a fault injection system that is used to simulate SEU. A lot of tests were conducted under the system,and the results prove the the necessity and correctness of the combination of the method.
邓涛、钟胜
微电子学、集成电路航空航天技术电子技术应用
单粒子翻转现场可编程门阵列配置帧回读部分重配三模冗余故障注入
FPGAsignle event upsetconfiguration framereadbackpartial reconfigurationTMRfault injection
邓涛,钟胜.一种可靠的防单粒子翻转系统设计[EB/OL].(2012-11-06)[2025-08-10].http://www.paper.edu.cn/releasepaper/content/201211-72.点此复制
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