In2Se3纳米线的合成及相变机理研究
Rational Synthesis of In2Se3 Nanowires and their phase-change behavior
一维相变纳米材料为在纳米尺度研究相变过程和材料热性能提供了一个良好的科学平台,同时也是下一代高存储密度相变存储器的关键材料。一维相变纳米线在相变存储器上的应用正在被广泛的研究,In2Se3纳米线作为一种重要的非易失性存储材料,它有着很高的电阻率,1E5的电阻转变率,在数据存储上,可以有比GeTe 和 Ge2Sb2Te5 纳米线更低的能耗。本文通过热气相沉积法制备α-和κ-In2Se3纳米线,并通过原位同步辐射XRD监测了In2Se3纳米线在热退火过程中的晶体转变情况。数据结果显示κ-In2Se3纳米线在500℃转变为α相,在更高的温度700℃下转变为5-5层状的高温α相,并且这种转变在温度降低时是不可逆的。之后,借助于Materials Studio模拟软件,基于密度泛含理论,模拟了不同原子堆积的In2Se3 模型结构,并且模拟衍射数据和同步辐射衍射数据结果很吻合,此外,研究还发现,退火前后的纳米线的电阻率变化很大。
Low-dimensional phase-change nanostructures provide a valuable scientific research platform for understanding the phase-transition behavior and material thermal properties at nanoscale, in addition to their potential to achieve super-dense data storage.One-dimensional phase-change nanowires have been investigated for the fabrication of electrically operated phase change random access memory (PRAM). Among them, In2Se3 nanowire is highly promising for applications in nonvolatile data storage since it exhibits high resistivity, a resistance switching ratio of 1E5, and memory switching at much lower input power/energy than for GeTe and Ge2Sb2Te5 nanowire devices. This paper reports the preparation of α- and κ-phase In2Se3 nanowires by thermal evaporation and investigation of their phase transformations in-situ by synchrotron radiation X-ray diffraction (XRD) during a thermal annealing process. The κ-phase transformed to α-phase at 500?C and eventually transformed to high temperature α-phase with a layered structure of 5 atoms-5 atoms at 700?C irreversibly. Different atomistic structures of In2Se3 were modeled and optimized by DFT (Density Functional Theory) method, which correlates well with the synchrotron radiation XRD results. The In2Se3 nanowires also exhibit a large difference in resistivity before and after annealing.
孙旭辉、高婧、李钦亮、李洋、彭明发
晶体学半导体技术材料科学
材料学In2Se3纳米线相变原位XRD密度泛函
Materials ScienceIn2Se3NanowiresPhase-changeIn-situ XRDDFT
孙旭辉,高婧,李钦亮,李洋,彭明发.In2Se3纳米线的合成及相变机理研究[EB/OL].(2015-12-09)[2025-08-02].http://www.paper.edu.cn/releasepaper/content/201512-454.点此复制
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