一种基于粒子滤波理论的IGBT剩余寿命预测方法

With the increasingly widespread application, the requirement for PHM of IGBT is becoming gradually urgent. Based on particle filter theory, a method for remaining useful life(RUL) prediction of IGBT is proposed. Firstly, the deterioration parameters on-state VCE and ICE are extracted by temperature cycling test, then a model is developed based on the degradation trend exhibited by deterioration parameters. In the end, PF approach is applied to the IGBT's RUL prediction with the mentioned model. The results show that the proposed prediction method can achieve a high prediction accuracy.