基于遗传算法的自反馈测试生成方法

In this paper, we present a test generate method based on genetic algorithm by Circuit-under-Test Automatically of build-in-self-test. The algorithm use multiple weighted set, which test set composed by two test subsets from Mintest. and each subset corresponds to a weight set. The experiment results show that this method not only can achieve the same fault coverage, but also can Increase the fault coverage and decrease in test vector length compared with the hybrid BIST.