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GaAs纳米线轴向pn结阵列的电学特性研究

he Electronic Property Exploration of the GaAs Nanowire Axial p-n Junction Array

中文摘要英文摘要

与普通平面生长不同,半导体纳米线在生长时可以沿着垂直于侧面的两个维度释放由于晶格不匹配引起的应力应变,可以方便地在径向或轴向串接生长晶格失配的材料。而纳米线pn结是几乎所有纳米线器件的基础结构之一,所以对纳米线pn结特性的研究也显得极为重要。本文将生长具有轴向pn结结构的GaAs纳米线阵列,并利用聚酰亚胺实现纳米线阵列的平面化,测量并分析纳米线阵列的I-V曲线,探索出一套测试纳米线pn结电学特性的有效测量方案。

ifferent from the planar material growth, the bottom-up grown semiconductor nanowire can effectively release strain results from lattice mismatch between different materials, thus can be used to fabricate axial or radial heterostructures. And nanowire p-n junction is building block of most electronic and photoelectronic devices based on nanowire, study of nanowire p-n junction properties thus be of great importance. In present work, axial GaAs p-n junction arrays were grown, planarization of samples were realized with polyimide, I-V curves were then measured and analyzed. The clear rectifying behavior indicates a reliable growth and characterization of nanowire p-n.

陈雄、李军帅、张霞

半导体技术电子技术概论光电子技术

半导体技术GaAs纳米线pn结电学特性

Semiconductor technologyGaAs nanowirepn junctionelectrical property.

陈雄,李军帅,张霞.GaAs纳米线轴向pn结阵列的电学特性研究[EB/OL].(2013-12-31)[2025-08-02].http://www.paper.edu.cn/releasepaper/content/201312-1264.点此复制

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