lGaN/GaN HEMT器件的高温小信号模型分析
High-temperature Small-signal Model Analysis of AlGaN/GaN HEMT
基于GaN材料耐高温、抗辐照等的优越特性,使GaN与Si材料相比,更适合应用于航空航天以及太空探测的领域上。本文测试了AlGaN/GaN高电子迁移率晶体管(HEMT)在不同工作温度时的S参数,对器件的小信号模型参数进行提取,得出AlGaN/GaN HEMT器件小信号等效高温电路模型的参数变化。结果表明,温度对器件的直流特性与小信号模型有很大的影响,因此高温情况下的小信号建模仍然必不可少。
Based on the superior characteristics of GaN materials, such as high temperature resistance and radiation resistance, compared with Si materials, GaN is more suitable for applications in the fields of aerospace and space exploration. In this paper, the S parameters of AlGaN/GaN High Electron Mobility Transistor (HEMT) under different operating temperatures are tested,and extract the small signal model parameters of the device. Obtain the parameter changes of the small-signal equivalent high-temperature circuit model of AlGaN/GaN HEMT devices. The results show that temperature has a great influence on the DC characteristics of the device and the small-signal model, so the small-signal modeling at high temperature is still essential.
梁红伟、陈帅昊、夏晓川、梁晓华、梁永凤、徐瑞良、薛东阳、刘力涛、韩永坤、张贺秋
半导体技术电子电路航空航天技术
高电子迁移率晶体管高温小信号模型参数提取
High Electron MobilityTransistorHigh temperatureSmall signal modelParameter extraction
梁红伟,陈帅昊,夏晓川,梁晓华,梁永凤,徐瑞良,薛东阳,刘力涛,韩永坤,张贺秋.lGaN/GaN HEMT器件的高温小信号模型分析[EB/OL].(2021-03-23)[2025-08-06].http://www.paper.edu.cn/releasepaper/content/202103-255.点此复制
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