探针对原子力显微镜成像的影响
he Probe Impact on Imaging of Atomic Force Microscope
原子力显微镜（Atomic Force Microscope, AFM）的一个重要应用就是对样品表面的微纳米级尺寸特征进行成像，但在扫描成像的过程中，由于针尖的影响作用，使得扫描所获图像是AFM探针和样品共同作用的结果，而不是样品形貌的真实描述。本文通过用具有不同形状、尺寸针尖的探针对同一样品进行成像，将所得图像进行分析、对比，模拟和实验结果表明，为获得更准确的特征尺寸成像，对有不同特征尺寸的样品，需要选择适合的探针对其实施成像。
FM plays an important role in imaging feature size of samples with micro/ nano-scale. But as the interaction between the probe and sample, the image is usually a combination of them, and it is just an approximate description of the sample. This paper presents the images of a fixed sample with probe of different shapes and sizes, compares the data and concludes the results. Simulation and experiments demonstrate that the probe should be chosen properly to image based on the scale of different samples.
刘晓刚、宋正勋、李丽丽、王作斌
物理学材料科学
原子力显微镜特征尺寸成像针尖形状
FMcharacteristic sizeimagingtip shape
刘晓刚,宋正勋,李丽丽,王作斌.探针对原子力显微镜成像的影响[EB/OL].(2013-10-17)[2025-08-19].http://www.paper.edu.cn/releasepaper/content/201310-195.点此复制
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