涂层杨氏模量的测量方法
Investigation on measuring the Young’s modulus of coatings
杨氏模量是一个特别重要的材料参数,经常用来评价涂层(薄膜)的特性,对接触应力场、涂层的剥离、断裂和涂层内部的残余应力状态有重要影响。本文介绍了当前测量涂层杨氏模量的方法及其原理,并分析了各种方法适用的涂层范围,为涂层弹性模量测量方法的选择提供基础。
The Young’s modulus is the most important materials parameter, which is used to evaluate the characteristic of coatings(or thin films).The stress-strain behavior, contact stress field, cracking, spalling and residual stress states of coatings systems are all functions of the Young’s modulus. In this paper, the methods for measuring the Young’s modulus are introduced, as well as principle and applicable domain for each method is stated. The review can provide some foundation for choosing the method to measure the Young’s modulus of coatings or thin films.
徐连勇、程应科、张建军
材料科学力学
涂层薄膜杨氏模量测量方法
coatingsthin filmsYoung\
徐连勇,程应科,张建军.涂层杨氏模量的测量方法[EB/OL].(2006-11-20)[2025-08-02].http://www.paper.edu.cn/releasepaper/content/200611-518.点此复制
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