β-氧化镓基日盲紫外探测器性能研究
Study on the performance of β-gallium oxide solar-blind UV detector
第三代半导体氧化镓禁带宽度大,击穿场强高,电子饱和速率快,具有出色的物理化学性质,在半导体光电器件领域有着出色的发展前景。基于β-氧化镓的同质外延日盲紫外探测器进行了深入研究,通过电学性能测试,研究探测器的性能。制备的探测器均对日盲紫外光产生了响应,其中光电导型探测器在上升时间在室温以及400℃以上达到了10 ms之内,下降时间在200 C以及400℃左右达到了10 ms之内。响应度呈现出随着温度增加先增加后减少再增加,同一温度下,随着偏压的增大响应度增大,在35V偏压,600℃得到最高响应度22 mA/W;垂直肖特基探测器,响应时间随着温度升高,先增大后减小,在室温及700℃、外加电压15V条件下,最低为0.5 ms。响应度随着温度的升高,先升高再降低最后又快速提升的趋势,同一温度下,随着偏置电压的增大,响应度增大,在700℃,偏压45V时,达到了0.24 A/W。
he third generation of semiconductorgallium oxide has great band-gap width, high breakdownfield strength, fast electron saturation rate, excellent physical and chemical properties, and has excellentdevelopment prospects in the field of semiconductor optoelectronic devices. Based on β-gallium oxide homogeneity epitaxy, solar-blind ultraviolet detector were studied, through the electrical performancetest, study the performance of the detector. All the detectors are responsive to solar-blind UV light. Forthe photoconductive detectors, the ascending time reaches within 10 ms at room temperature and above400 C. and the descending time reaches within 10 ms at 200 C and around 400 C. The responsivityfirstly increases and then decreases with the increase of temperature. At the same temperature, theresponsivity increases with the increase of bias. At 35 V bias and 600 C, the highest responsivity is 22mA/W. The response time of vertical Schottky detector increases first and then decreases with theincrease of temperature. The lowest response time is 0.5ms at room temperature,700 C and 15 Vapplied voltage. With the increase of temperature, the responsivity increases first, then decreases andfinally increases rapidly. At the same temperature, the increase of bias voltage leads to the increase ofresponsivity,which reaches 0.24A/W at 700C and 45 V.
张赫之、张汉卿
半导体技术光电子技术物理学
微电子学与固体电子学β-氧化镓同质外延日盲紫外探测器
Microelectronics and Solid State Electronicsβ-gallium oxideHomogeneous epitaxySolar-blind UV detector
张赫之,张汉卿.β-氧化镓基日盲紫外探测器性能研究[EB/OL].(2023-05-19)[2025-08-19].http://www.paper.edu.cn/releasepaper/content/202305-164.点此复制
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