减少自反馈测试硬件代价的两种方法

Circuit-Under-Test (CUT) is regarded as a kind of available resource, not only a tested object, in Self-Feedback Testing. By feedback connecting some of a CUT’s interior nodes to it’s input terminals, the CUT can generate and apply a test set serially after a initial vector applied from the outside of the CUT. In this paper, the old grouping method and the feedback nodes assignments are improved. A depth priority algorithm with information matrixes for a common path in a number of directed graphs is presented. The experimental results on ISCAS85 benchmark circuits and MinTest test sets demonstrate that the proposed algorithm can reduce the extra area and improve the fault efficiency.